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主要用途:用于SiC电力电子器件制造,Si基器件制造及其他特种应用。通过向晶圆选择性注入掺杂元素如Al、B、N、P、H、As、Cu、Ag、Au、Er、Te等,形成p-n结或调控器件性能参数等。Main application: Focus on the manufacture of SiC power electronics devices and Si-based devices. By selectively implanting doped elements such as AI, B, N, P, H, As, Cu, Ag, Au, Er, Te, p-n junctions are formed and device performance parameters can be adjusted.
主要特点:Main Characteristics
1. 静电+机械扫描平行束注入;Electrostatic plus mechanical scan, and parallel beam implanting;
2. 采用手动装卸片,引束及注入自动运行,整机成本降低,适用于小批量生产或实验用途;Manually load and unload wafer, auto beam-tune and implant, the cost is reduced, suitable for small amount manufacture or lab use;
3. 靶室晶片装载支持定制化设计,4靶位,兼容4、6、8英寸,可同时支持高、低温配置、非标准晶片的装载;4 target platens that can provide customization of wafer chuck, compatible with 4 inch, 6inch and 8 inch wafer, allow high-temp and room-temp target platens at the same time, suitable for customised size wafer implant.
4. 可配置专用坩埚Al离子源,维护周期大于350小时,可用于SiC功率器件的Al离子注入工艺;With a selective specified crucible Al ion source, which makes PM intervals greater than 350h, it can be used in Al ion implant jobs for SiC power electronics devices;
5. 可配置专用离子源,适用于重金属离子等特种离子注入需求;With a selective specific ion source, it can be used in special ion implanting such as heavy metal;
6. 可配置高温加热靶,最高加热温度超过600℃;Selective high-temperature target platen, the max temperature is over 600℃;
主要技术指标Main Parameters:
离子能量(Energy) | 20-380keV(单电荷Sinlge Charge) |
晶片尺寸(Wafer Size) | 4 inch,6 inch,其他特殊尺寸(other special size) |
剂量注入范围(Dose Range) | 2E11 - 1E16 ions/cm2 |
产品应用(Applications) | Si基器件、SiC器件及其他特种应用 Manufacture of Si-based devices, SiC devices and other special applications |